ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,013, issued on Oct. 27, was assigned to Teledyne FLIR Defense Inc. (Thousand Oaks, Calif.). "Anomalous pixel processing using adaptive deci... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,014, issued on Oct. 27. "Methods and systems for hyperspectral image correction" was invented by Rahul Raj (Patna, India) and Karthik Kumar... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,015, issued on Oct. 27, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Image restoration system and image restoration method" was invent... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,016, issued on Oct. 27, was assigned to HYUNDAI MOBIS Co. LTD. (Seoul, South Korea). "Image correction method and system" was invented by I... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,017, issued on Oct. 27, was assigned to Koninklijke Philips N.V. (Einhoven, Netherlands). "HDR out of gamut adjusted tone mapping" was inve... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,018, issued on Oct. 27, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Parallel tone mapping in high-resolution ima... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,019, issued on Oct. 27, was assigned to Spirit AeroSystems Inc. (Wichita, Kan.). "Feature inspection system" was invented by Mark Davis Hay... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,020, issued on Oct. 27, was assigned to Siemens AG (Munich). "Machine learning model for automatically detecting faults using optical inspe... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,021, issued on Oct. 27, was assigned to Pictometry International Corp. (Rochester, N.Y.). "Roof condition assessment using machine learning... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,022, issued on Oct. 27, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel). "Optimization of a metrology algorithm for examina... Read More